KAP单晶不同位错密度区域点阵常数变化的“就地”双晶测量

In situ measurements of lattice constants changes corresponding to different dislocation density ranges in KAP (n, -n) double crystals diffraction

本文报道用X射线双晶衍射的(n,-n)几何排列对不同位错密度区域点阵常数的测试结果。从一对(001)晶片的(001)晶面的对称反射的测试结果表明,不同位错密度区域的点阵常数变化的最大范围为3.8～1.92×10^(-4)nm。

In situ measurements of the relative changes in the lattice constants of KAP corresponding to the different dislocation density ranges has been earried out by means of (n,-n) double crystal diffract)metry. The (n, -n) double crystal reflection of the (001) plane with Cuka radiation shows that the relative change in lattice constants due to dislocations are in the range of 3.8～19.2×10-4nm.