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Texturization and rounded process of silicon wafers for heterojunction with intrinsic thin-layer solar cells 被引量:1

Texturization and rounded process of silicon wafers for heterojunction with intrinsic thin-layer solar cells
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摘要 Heterojunction with intrinsic thin-layer (HIT) solar cells are sensitive to interface state density. Tradi- tional texture process for silicon solar cells is not suitable for HIT one. Thus, sodium hydroxide (NaOH), isopropanol (IPA) and mixed additive were tentatively introduced for the texturization of HIT solar cells in this study. Then, a mixture including nitric acid (HNO3), hydrofluoric acid (HF) and glacial acetic acid (CH3COOH) was employed to round pyramid structure. The morphology of textured surface and the influence of etching time on surface reflectance were studied, and the relationship between etching time and surface reflectance, vertex angle of pyramid structure was analyzed. It was found that the mixture consisting of 1.1 wt% NaOH, 3 vol% IPA and 0.3 vol% additives with etching time of 22.5 min is the best for H1T solar cells under the condition of 80℃. Uniform pyramid structure was observed and the base width of pyramid was about 2-4 μm. The average surface reflec- tance was 11.68%. Finally the effect of different processes on the performance of HIT solar cells was investigated. It was shown that these texturization and rounding techni- ques used in this study can increase short circuit current (Jsc), but they have little influence on fill factor (FF) and open circuit voltage (Voo) of HIT solar cells. Heterojunction with intrinsic thin-layer (HIT) solar cells are sensitive to interface state density. Tradi- tional texture process for silicon solar cells is not suitable for HIT one. Thus, sodium hydroxide (NaOH), isopropanol (IPA) and mixed additive were tentatively introduced for the texturization of HIT solar cells in this study. Then, a mixture including nitric acid (HNO3), hydrofluoric acid (HF) and glacial acetic acid (CH3COOH) was employed to round pyramid structure. The morphology of textured surface and the influence of etching time on surface reflectance were studied, and the relationship between etching time and surface reflectance, vertex angle of pyramid structure was analyzed. It was found that the mixture consisting of 1.1 wt% NaOH, 3 vol% IPA and 0.3 vol% additives with etching time of 22.5 min is the best for H1T solar cells under the condition of 80℃. Uniform pyramid structure was observed and the base width of pyramid was about 2-4 μm. The average surface reflec- tance was 11.68%. Finally the effect of different processes on the performance of HIT solar cells was investigated. It was shown that these texturization and rounding techni- ques used in this study can increase short circuit current (Jsc), but they have little influence on fill factor (FF) and open circuit voltage (Voo) of HIT solar cells.
出处 《Frontiers of Optoelectronics》 EI CSCD 2014年第1期46-52,共7页 光电子前沿(英文版)
关键词 TEXTURIZATION reflectance PYRAMID hetero-junction with intrinsic thin-layer (HIT) solar cells texturization, reflectance, pyramid, hetero-junction with intrinsic thin-layer (HIT) solar cells
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