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Analysis of Intrinsic Degradation Mechanism in Organic Light-Emitting Diodes by Impedance Spectroscopy 被引量:2

Analysis of Intrinsic Degradation Mechanism in Organic Light-Emitting Diodes by Impedance Spectroscopy
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摘要 The organic light-emitting diodes (OLEDs) in the sandwiched structures ITO/poly[3,4-ethylenedioxythiopene] (PEDOT) /poly[9,9-dioctylfluorene-co-4, 7-di-2-thienyl-2,1,3-benzothiadiazole] (PFO-DBT15) /Ba/A1 are fabricated We use impedance measurements to investigate the degradation of aged OLEDs. A detailed analysis of the impedance spectra as functions of frequency and dc bias yields information about the injection of the interracial electrode and the transport properties of emissive layer changes. Morphology differences between degraded and undegraded devices can also be observed by a scanning electron microscope. We perform comparative studies of the impedance spectroscopy (IS) of undegraded and degraded devices by both experiment and simulation approaches to explain the degradation mechanism for OLEDs. The IS of the undegraded device can be well understood by simply adopting the conventional RC equivalent circuits. For the degraded device, however, the successful model of the impedance spectroscopy results needs to take into account the more complicated situ- ations, and we adopt a constant phase element to meet the experimental and simulated data and discuss the reasons caused by the problem. The organic light-emitting diodes (OLEDs) in the sandwiched structures ITO/poly[3,4-ethylenedioxythiopene] (PEDOT) /poly[9,9-dioctylfluorene-co-4, 7-di-2-thienyl-2,1,3-benzothiadiazole] (PFO-DBT15) /Ba/A1 are fabricated We use impedance measurements to investigate the degradation of aged OLEDs. A detailed analysis of the impedance spectra as functions of frequency and dc bias yields information about the injection of the interracial electrode and the transport properties of emissive layer changes. Morphology differences between degraded and undegraded devices can also be observed by a scanning electron microscope. We perform comparative studies of the impedance spectroscopy (IS) of undegraded and degraded devices by both experiment and simulation approaches to explain the degradation mechanism for OLEDs. The IS of the undegraded device can be well understood by simply adopting the conventional RC equivalent circuits. For the degraded device, however, the successful model of the impedance spectroscopy results needs to take into account the more complicated situ- ations, and we adopt a constant phase element to meet the experimental and simulated data and discuss the reasons caused by the problem.
出处 《Chinese Physics Letters》 SCIE CAS CSCD 2014年第2期126-129,共4页 中国物理快报(英文版)
基金 Supported by the National Natural Science Foundation of China under Grant No 51010003.
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