摘要
文章简要地介绍了一种由自制微型薄膜电阻加热台和商用扫描力显微镜构成的变温扫描力显微镜系统 ,获得的样品最高温度达 2 15℃ .运用该系统对铁电和铁磁畴随温度的演变进行了研究 ,在TGS单晶和人工磁化的高密度软磁盘磁记录材料中分别观察到了居里点附近发生的铁电 -顺电及铁磁 -顺磁相变 .文中还介绍了变温扫描力显微镜在其他材料领域的微区物性研究中应用的可能性 .
In this paper, we briefly discuss an newly developed temperature variable scanning force microscopy (TVSFM) which is composed by a home\|built mini film resistor heating stage and a commercial atomic force microscopy. With the heating stage, the sample surface temperature can be as high as 215℃. The stage has been applied to in situ observation of the ferroelectric\|paraelectric phase transition of TGS single crystalline and the ferromagnetic\|paramagnetic phase transition of the magnetic film from a floppy disk around Curie temperature. The potential applications of this technology in other fields are also described.
出处
《物理》
CAS
2000年第9期556-559,549,共5页
Physics
基金
国家"九五"攀登计划
香港RGC基金资助
关键词
变温扫描力显微镜
微区测量
材料
物性
TVSFM, ferroelectric domain, ferromagnetic domain, local measurement
