期刊文献+

时序敏感的容软错误电路选择性加固方案 被引量:7

Timing-aware selective hardening technique for soft-error-tolerance
下载PDF
导出
摘要 由于瞬态故障引起的电路软错误问题越来越严重,现有的选择性加固方案通常带来较大的时序和面积开销。针对这些问题,提出了在电路时序松弛路径使用高可靠性时空冗余触发器来加固电路的方案。该方案在不降低电路性能且面积开销很小的情况下,达到电路容错性能的最大提高。ISCAS’89基准电路的实验数据显示,平均面积开销为60.26%就能将整个电路的软错误率降低90%以上。针对可靠性、性能和面积开销,提出了综合评价指标RAPP。本方案在加固30%、50%、70%和90%时,和相关文献相比,RAPP值都是最小的,达到了三者的最佳折中。 Because the digital circuit soft error problem caused by transient fault is getting worse,the existing circuit hardening techniques usually reduce the performance of circuit and serious area overhead are unacceptable.To solve the problem,high reliability temporal redundancy flip-flop is used to hardening circuit on the path of timing slack.This technique can achieve the maximum improvement of circuit fault-tolerant without reducing the performance of circuit,and the area overhead is small.The experimental data of ISCAS' 89 benchmark circuits show that it can reduce the soft error by more than 90% at average area overhead of 60.26%.For reliability,performance and area overhead,a comprehensive evaluation metric RAPP is proposed.The proposed technique is the smallest of the three product at hardening of 30%,50%,70% and 90%,compared with other relative techniques,reached better tradeoff between reliability,performance and area overhead.
出处 《电子测量与仪器学报》 CSCD 2014年第3期247-254,共8页 Journal of Electronic Measurement and Instrumentation
基金 国家自然科学基金(61274036 61106038 61106020 61371025) 博士点基金(20110111120012)
关键词 时序裕度 软错误 电路性能 可靠性 选择性加固 timing slack soft error circuit performance reliability selective harden
  • 相关文献

参考文献23

二级参考文献122

  • 1王京,杨波.低轨卫星微电子器件SER仿真分析[J].电子质量,2005(7):34-35. 被引量:2
  • 2黄海林,唐志敏,许彤.龙芯1号处理器的故障注入方法与软错误敏感性分析[J].计算机研究与发展,2006,43(10):1820-1827. 被引量:31
  • 3傅忠传,陈红松,崔刚,杨孝宗.处理器容错技术研究与展望[J].计算机研究与发展,2007,44(1):154-160. 被引量:36
  • 4周学海,余洁,李曦,王志刚.基于指令行为的Cache可靠性评估研究[J].计算机研究与发展,2007,44(4):553-559. 被引量:4
  • 5Baumann R. Soft errors in advanced computer systems [J]. IEEE Design & Test of Computers, 2005, 22(3) : 258-266
  • 6Leveugle R, Ammari A. Early SEU fault injection in digital, analog and mixed signal circuits: a global flow [C] // Proceedings of the Design, Automation and Test in Europe Conference and Exhibition (DATE'04), Paris, 2004: 590- 595
  • 7Choi G S, Iyer R K. FOCUS: an experimental environment for fault sensitivity analysis [J]. IEEE Transactions on Computers, 1992, 41(12): 1515-1526
  • 8Thaker P A, Agrawal V D, Zaghloul M E. A test evaluation technique for VLSI circuits using register-transfer level fault modeling [J]. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2003, 22(8): 1104-1113
  • 9Sugihara M, Ishihara T, Hashimoto K, et al. A simulation based soft error estimation methodology for computer systems [C] //Proceedings of the 7th International Symposium on Quality Electronic Design, San Jose, 2006: 196-203
  • 10Cha H, Rudnick E M, Patel J H, et al. A gate-level simulation environment for alpha particle-induced transient faults [J]. IEEE Transactions on Computers, 1996, 45(11) : 1248-1256

共引文献52

同被引文献65

引证文献7

二级引证文献19

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部