高频基材介电参数带状线测试的误差修正方法

The correction method of deviation of the dielectric parameter of the stripline test for high frequency base material

基于GB/T 12636"微波介质基片复介电常数带状线测试方法"的现有带状线测试系统的主要误差来源之一——边缘场效应引起的有效增长量ΔL,本课题组在Lab VIEW平台上开发了一款测试软件,通过软件实现了对有效增长量ΔL的修正,较好地改善了系统测量介电常数的精度。

There has a set of stripline test assembly which build according to GB/T 12636“Stripline test method for complex permittivity of microwave dielectric substrates”. The assembly has one of the main deviation-fringe ifeld effect induced effective increase quantityΔL. So we develop a kind of test software on the basic of Lab VIEW in our lab, which can correct the effective increase quantityΔL, and improve the measurement precision of dielectric parameter of the assembly.