摘要
超细颗粒由于其具有一系列特殊的性质 ,在国民经济和国防现代化以及现代高科技领域具有重要价值 ,有着广阔的应用前景。超细颗粒的测量方法和测试技术则是颗粒研究领域的热点。笔者分析并综述了现代颗粒测试的方法和技术 ,讨论了这些方法应用于亚微米级超细颗粒的测量时存在的问题和局限。
Due to a series of wonderful characteristics, submicron particles are of high value in national economy, defense modernization and high technology fields, with wide application prospects. Submicron particle sizing methods and techniques are difficult problems in particle research field. Modern methods for particle sizing are stated and analyzed. Some problems are discussed when these methods are used for submicron particles.
出处
《重庆大学学报(自然科学版)》
EI
CAS
CSCD
2000年第5期100-103,共4页
Journal of Chongqing University