摘要
Abstract： The effect of Al_2O_3 doping on the microstructure and electrical properties of the ZnO- Pr_6O11-CO_3O_4-MnCO_3-Y_2O_3 system was investigated in the range of 0.0-0. lmol%. The results reveal that Al_2O_3 doping has slight influence on the densification process. The microstructure of the ceramics comprises of ZnO phase, ZnAl_2O_4 spine phase and Pr-rich phases. The addition of Al_2O_3 greatly affects the electrical properties. The varistor voltage （E_1mA/cm^2） of ZPCMYAl samples decreases over a wide range from 5 530 V/cm to 1 844 V/cm with the increasing Al_2O_3 content. The nonlinear exponent（a） increases with the increasing Al_2O_3 content to 0.01mol%, whereas it is decreased by the further doping. The ZPCMYAI-based varistor ceramics with 0.01mol% Al_2O_3 exhibit the best electrical properties, with the nonlinear exponent （ct） attaining the highest value of 33.4 and the lowest leakage current of 2.7 μA. The capacitance-voltage （C-V） measurement shows that the donor density （Nd） at the grain boundaries increase from 1.58×10^18 to 3.15×10^18 cm^-3, the barrier height （Чb） increases from 1.60 to 2.36 eV, and the depletion layer width （t） decreases from 24.9 to 21.6 nm.
Abstract： The effect of Al_2O_3 doping on the microstructure and electrical properties of the ZnO- Pr_6O11-CO_3O_4-MnCO_3-Y_2O_3 system was investigated in the range of 0.0-0. lmol%. The results reveal that Al_2O_3 doping has slight influence on the densification process. The microstructure of the ceramics comprises of ZnO phase, ZnAl_2O_4 spine phase and Pr-rich phases. The addition of Al_2O_3 greatly affects the electrical properties. The varistor voltage （E_1mA/cm^2） of ZPCMYAl samples decreases over a wide range from 5 530 V/cm to 1 844 V/cm with the increasing Al_2O_3 content. The nonlinear exponent（a） increases with the increasing Al_2O_3 content to 0.01mol%, whereas it is decreased by the further doping. The ZPCMYAI-based varistor ceramics with 0.01mol% Al_2O_3 exhibit the best electrical properties, with the nonlinear exponent （ct） attaining the highest value of 33.4 and the lowest leakage current of 2.7 μA. The capacitance-voltage （C-V） measurement shows that the donor density （Nd） at the grain boundaries increase from 1.58×10^18 to 3.15×10^18 cm^-3, the barrier height （Чb） increases from 1.60 to 2.36 eV, and the depletion layer width （t） decreases from 24.9 to 21.6 nm.
基金
Funded by the Changzhou Science and Technology Innovation Project(Nos.CC20110048 and CN20100051)
