基于EFDR编码压缩的非确定位填充算法

An X-filling algorithm for EFDR code

针对EFDR编码算法中非确定位填充算法的不足,提出了一种基于EFDR编码压缩算法的非确定位填充算法(ESA)。该算法在填充测试数据中的非确定位时,依据EFDR编码算法的特点,考虑非确定位两边确定位的特征以及非确定位游程自身的特点,对非确定位采用全0填充、全1填充和分块填充三种方法,从而提高了EFDR编码压缩算法的压缩效率并减少了测试时间,同时由于算法仅对测试数据的非确定位进行操作,不会增加测试的物理开销。实验结果表明,在不增加测试功耗和测试硬件开销的情况下,实现了EFDR编码压缩算法压缩效率的提高和测试时间的减少。

To address the problem of the shortcoming of the don＇t case bits （Xs） filling algorithm in EFDR coding tecbnique,a novel EFDR-based X-filling algorithm （ESA） is proposed. According to the coding characteristic of EFDR,the proposed X-filling algorithm fills the don＇t care bits in all 0s,all 1s or block-partitioned filling based on the properties of the runs of don＇t care bits and the specified bits on both sides of don＇t care bits. The proposed ESA algorithm can achieve higher test compression effect of EFDR and decrease the test application time. Simultaneously, it will not affect the test hardware overhead and test power dissipation of EFDR since the proposed X filling algorithm only fills the don＇t care bits in the test sets as other X-filling techniques. Experimental results demonstrate the effectiveness of the proposed technique.