摘要
本文研究设计了基于LVDS的存储测试系统,整个系统的设计思路是首先在LVDS接口芯片端接收由采集器件采集到的大量数据,并将接收到的差分信号数据转换为TTL信号。然后由FPGA控制将数据写入FLASH存储器中,最终通过输出接口由计算机来读取存入存储器的数据。
The design of storage test system based on LVDS, Design ideas of the whole system：at first, the LVDS interface chip is receiving a large amount of data collected by the collecting device, and changing the difference signal into TTL signal, then by the FPGA control data into the FLASH memory, finally through the output interface to read the data stored in memory by the computer.
