三极管电路中三极管BE结烧坏故障的研究

Research on Burned Fault of Transistor BE Junction in Transistor Circuits

基于探索三极管电路的核心元器件三极管的一种特殊故障检查方法的目的,本文通过理论推导的方法,结合创新的实验意识,找出了该故障现象的本质原因,从而总结出检查三极管BE结烧坏故障的方法。经实践证明,结论是基层电子测试与维护工作的一个非常有力的工具。

The transistor is the core component in the transistor circuits.For the purpose of exploring a particular fault inspection methods of the transistor,through theoretical derivation method,combining innovative experimental awareness,this paper identified the essential reasons of this fault phenomenon and proposed the method of checking burned fault in transistor BE Junction.Practice has proved.The conclusion of this paper is a very powerful tool in electronic test and maintenance work at the grass-roots level.