期刊文献+

Simulation of Capacitively Coupled Dual-Frequency N_2,O_2,N_2/O_2 Discharges:Effects of External Parameters on Plasma Characteristics

Simulation of Capacitively Coupled Dual-Frequency N_2,O_2,N_2/O_2 Discharges:Effects of External Parameters on Plasma Characteristics
下载PDF
导出
摘要 A one-dimensional fluid model is adopted to simulate the characteristics of N2, O2, and N2/O2 dual-frequency (DF) capacitively coupled plasmas (CCPs) under typical conditions in PECVD technologies. Not only the ground, the excited states but also the vibration levels of the main species are considered. The study focuses on the influence of external parameters such as matching of the high-frequency (HF) and low-frequency (LF), HF and LF of the voltage sources, as well as discharge pressures, on physical characteristics of discharges. The results show that the decoupling of the two sources is possible by increasing the applied HF, the electron density and ion flux are determined only by the HF of the voltage source, whereas the LF has a little influence on the plasma characteristics. In addition, the matching of frequency affects the characteristics of discharges to some extent. Fhrthermore, the pressure is a main external parameter affecting the characteristics of discharges, and a small amount of oxygen in N2 plasma can efficiently increase N+ ion flux incident onto the electrode and the density of N atom. A one-dimensional fluid model is adopted to simulate the characteristics of N2, O2, and N2/O2 dual-frequency (DF) capacitively coupled plasmas (CCPs) under typical conditions in PECVD technologies. Not only the ground, the excited states but also the vibration levels of the main species are considered. The study focuses on the influence of external parameters such as matching of the high-frequency (HF) and low-frequency (LF), HF and LF of the voltage sources, as well as discharge pressures, on physical characteristics of discharges. The results show that the decoupling of the two sources is possible by increasing the applied HF, the electron density and ion flux are determined only by the HF of the voltage source, whereas the LF has a little influence on the plasma characteristics. In addition, the matching of frequency affects the characteristics of discharges to some extent. Fhrthermore, the pressure is a main external parameter affecting the characteristics of discharges, and a small amount of oxygen in N2 plasma can efficiently increase N+ ion flux incident onto the electrode and the density of N atom.
出处 《Plasma Science and Technology》 SCIE EI CAS CSCD 2014年第4期335-343,共9页 等离子体科学和技术(英文版)
基金 supported by National Natural Science Foundation of China(Nos.11335004 and 11375040) the Important National Science and Technology Specific Project(No.2011ZX02403-001)
关键词 CCP DUAL-FREQUENCY fluid model N2 discharge O2 discharge CCP, dual-frequency, fluid model, N2 discharge, O2 discharge
  • 相关文献

参考文献25

  • 1Gordiets B F, Ferreira C M, Guerra V L, et al. 1995, IEEE Transactions on Plasma Science, 23:750.
  • 2Ionin A A, Kochetov I V, Napartovich A P, et al. 2007, J. Phys. D: Appl. Phys., 40:R25.
  • 3Kutasi K, Loureiro J. 2007, J. Phys. D: Appl. Phys., 40:5612.
  • 4Kozlov K V, Brandenburg R, Wagner H-E, et al. 2005, J. Phys. D: Appl. Phys., 38:518.
  • 5Bi Z H, Dai Z L, Xu X, et al. 2009, Phys. Plasmas, 16: 043510.
  • 6Lieberman M A, Lichtenberg A J. 2005, Principles of Plasma Discharges and Material Processing. Wiley, New York, p.373.
  • 7Hsu C C, Nierode M A, Coburn J W, et al. 2006, J. Phys. D: Appl. Phys., 39:3272.
  • 8Itikawa Y. 2009, J. Phys. Chem. Ref. Data, 38:1.
  • 9Gudmundsson J T. 2004, A critical review of the reac- tion set for a low pressure oxygen processing discharge. University of Iceland, Science Institute, Iceland RH- 17-2004.
  • 10Gudmundsson J T. 2005, Electron excitation rate co- efficients for the nitrogen discharge. Science Institute, University of Iceland, Iceland RH-09-2005.

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部