摘要
基于局部放电测试系统,构建了不同温度和频率下聚酰亚胺薄膜的老化寿命模型,研究了频率和温度对聚酰亚胺薄膜损伤特性的影响。结果表明:不同温度下聚酰亚胺薄膜的电晕老化寿命与施加的电压频率成非线性衰减关系;频率增加,导致放电残余电荷不易扩散和单位时间内放电次数增多,绝缘寿命缩短;随着温度的升高,放电现象可能经历显著增强、平稳、再剧烈的3个阶段。
Based on a partial discharge(PD) test system, aging life models of polyimide film(PI) under different frequency and temperature was constructed, and the effects of frequency and temperature on the damage mechanism of the PI were studied. The results show that the corona aging life of the PI and the voltage frequency show a non-linear attenuation relationship under different temperature. With the in-crease of frequency, residual charge is hard to diffuse and partial discharge number increases in unit time, and the insulation life shortens. With the increase of temperature, discharge phenomena will experi-ence sharp, smooth and sharp again three stages.
出处
《绝缘材料》
CAS
北大核心
2014年第1期85-88,共4页
Insulating Materials
基金
国家自然科学基金(51177136)
关键词
温度
频率
聚酰亚胺薄膜
局部放电
老化寿命
frequency
temperature
polyimide film
partial discharge
aging time