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Metal dopants in HfO_2-based RRAM: first principle study

Metal dopants in HfO_2-based RRAM: first principle study
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摘要 Based on density-functional theory (DFT), the effects of metal dopants in HfO2-based RRAM are studied by the Vienna ab initio simulation package (VASP), Metal dopants are classified into two types (interstitial and substitutional) according to the formation energy when they exist in HfO2 cell. Several conductive channels are observed through the isosurface plots of the partial charge density for HfO2 doped with interstitial metals, while this phenomenon cannot be found in HfO2 doped with substitutional metals. The electron density of states (DOS) and the projected electron density of states (PDOS) are calculated and analyzed; it is found that the conduction filament in HfO2 is directly formed by the interstitial metals and further, that the substitutional metals cannot directly generate conduction filament. However, all the metal dopants contribute to the formation of the oxygen vacancy (Vo) filament. The formation energy of the Vo and the interaction between metal dopants and Vo are calculated; it is revealed that the P-type substitutional metal dopants have a strong enhanced effect on the Vo filament, the interstitial metal dopants have a minor assistant effect, while Hf-like and N-Woe substitutional metal dopants have the weakest assistant effect. Based on density-functional theory (DFT), the effects of metal dopants in HfO2-based RRAM are studied by the Vienna ab initio simulation package (VASP), Metal dopants are classified into two types (interstitial and substitutional) according to the formation energy when they exist in HfO2 cell. Several conductive channels are observed through the isosurface plots of the partial charge density for HfO2 doped with interstitial metals, while this phenomenon cannot be found in HfO2 doped with substitutional metals. The electron density of states (DOS) and the projected electron density of states (PDOS) are calculated and analyzed; it is found that the conduction filament in HfO2 is directly formed by the interstitial metals and further, that the substitutional metals cannot directly generate conduction filament. However, all the metal dopants contribute to the formation of the oxygen vacancy (Vo) filament. The formation energy of the Vo and the interaction between metal dopants and Vo are calculated; it is revealed that the P-type substitutional metal dopants have a strong enhanced effect on the Vo filament, the interstitial metal dopants have a minor assistant effect, while Hf-like and N-Woe substitutional metal dopants have the weakest assistant effect.
出处 《Journal of Semiconductors》 EI CAS CSCD 2014年第4期25-31,共7页 半导体学报(英文版)
基金 supported by the National Natural Science Foundation of China(No.61376106)
关键词 RRAM metal dopant conduction filament INTERSTITIAL SUBSTITUTIONAL RRAM metal dopant conduction filament interstitial substitutional
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  • 1Zhang Y, Kim S B, McVittie J P, etal. An integrated phase change memory cell with Ge nanowire diode for cross-point memory. Proceedings of the IEEE Symposium on VLSI Technology, 2007: 98.
  • 2Bedeschi F, Fackenthal R, Resta C, et al. A bipolar-selected phase change memory featuring multi-level cell storage. IEEE J SolidState Circuits, 2009, 44(1): 217.
  • 3Nakamoto H, Yamazaki D, Yamamoto T, et al. A passive UHF RF identification CMOS tag IC using ferroelectric RAM in 0.35-fLm technology. IEEE J Solid-State Circuits, 2007, 42(10): 101.
  • 4Tehrani S, Chen E, Durlam M, et al. High density nonvolatile magnetoresistive RAM. International Electron Devices Meeting, 1996: 193.
  • 5Chen E Y, Tehrani S, Zhu T, et al. Submicron spin valve magnetoresistive random access memory cell. J Appl Phys, 1997,81 (8): 3992.
  • 6Du Huan, Zhao Yuyin, Han Zhengsheng, et al. Investigation on interface pIanarization of driver IC for storage cells of MRAM. Chinese Journal of Semiconductors, 2006, 27(Suppl): 358.
  • 7Shang Dashan, Sun Jirong, Shen Baogen, et al. Resistance switching in oxides with inhomogeneous conductivity. Chin Phys B, 2013, 22(6): 067202.
  • 8Baek I G, Lee M S, Seo S, et al. Highly scalable nonvolatile resistive memory using simple binary oxide driven by asymmetric unipolar voltage pulses. IEDM Tech Dig, 2004: 587.
  • 9Wang Z, Griffin P B, McVittie J, et al. Resistive switching mechanism in ZnxCdl-x S nonvolatile memory devices. IEEE Electron Device Lett, 2007, 28(1): 14.
  • 10Sakamoto T, Sunamura H, Kawaura H, et al. Nanometer-scale switches using copper sulfide. Appl Phys Lett, 2003, 82(18): 3032.

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