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Shape and topology optimization for tailoring the ratio between two flexural eigenfrequencies of atomic force microscopy cantilever probe

Shape and topology optimization for tailoring the ratio between two flexural eigenfrequencies of atomic force microscopy cantilever probe
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摘要 In an operation mode of atomic force micro- scopy that uses a higher eigenmode to determine the physical properties of material surface, the ratio between the eigenfrequency of a higher flexural eigenmode and that of the first flexural eigenmode was identified as an important parameter that affects the sensitivity and accessibility. Structure features such as cut-out are often used to tune the ratio of eigenfrequencies and to enhance the performance. However, there lacks a systematic and automatic method for tailoring the ratio. In order to deal with this issue, a shape and topology optimization problem is formulated, where the ratio between two eigenfrequen- cies is defined as a constraint and the area of the cantilever is maximized. The optimization problem is solved via the level set based method. In an operation mode of atomic force micro- scopy that uses a higher eigenmode to determine the physical properties of material surface, the ratio between the eigenfrequency of a higher flexural eigenmode and that of the first flexural eigenmode was identified as an important parameter that affects the sensitivity and accessibility. Structure features such as cut-out are often used to tune the ratio of eigenfrequencies and to enhance the performance. However, there lacks a systematic and automatic method for tailoring the ratio. In order to deal with this issue, a shape and topology optimization problem is formulated, where the ratio between two eigenfrequen- cies is defined as a constraint and the area of the cantilever is maximized. The optimization problem is solved via the level set based method.
出处 《Frontiers of Mechanical Engineering》 SCIE CSCD 2014年第1期50-57,共8页 机械工程前沿(英文版)
关键词 atomic force microscopy cantilever probe eigenfrequency optimization atomic force microscopy, cantilever probe,eigenfrequency, optimization
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