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宽带梳状谱发生器校准技术研究 被引量：2

Research on the Calibration Technology for Broad-band Comb Generator
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摘要 本文介绍了利用取样示波器86100C校准带宽为50GHz的梳状谱发生器U9391F的方法。该方法用70GHz取样头测量梳状谱发生器输出端时域信号,对测量到的信号进行分析,修正取样示波器测量引入的时基误差和梳状谱发生器与取样头之间的阻抗失配,修正后得到梳状谱发生器的幅度谱和相位谱,实现了梳状谱发生器的校准,并给出幅度谱与相位谱校准结果的不确定度,分别为0.5dB和0.9°。 We introduce a method for 50 GHz comb generator calibration using Agilent 86100 C sampling oscilloscope. The 70 GHz sampling head measures the output time-domain signal of the comb generator. Then we correct the signal for time base error, including time base distortion, jitter and drift. By transforming the time-domain signal into frequency-domain, we obtain the amplitude and phase spec-trum. Then we acquire the calibration data we need. We also determine the uncertainties of the amplitude and the phase, which are less than 0. 5 dB and 0. 9o respectively.
作者 姜河 龚鹏伟 谌贝 谢文 马红梅 杨春涛
机构地区 北京无线电计量测试研究所
出处 《宇航计测技术》 CSCD 2014年第1期1-6,共6页 Journal of Astronautic Metrology and Measurement
关键词 梳状谱发生器 取样示波器 相位校准 不确定度 Comb generator Sampling oscilloscope Phase calibration Uncertainty
分类号 TM935 [电气工程—电力电子与电力传动]
  • 相关文献

参考文献10

  • 1W. Van Moer, Y. Rolain. A large-signal network analy-zer: Why is it needed- [J]. IEEE Microwave Magazine,2006,7(6):46 -62.
  • 2J. Verspecht. Calibration of a measurement system forhigh frequency nonlinear devices[D]. Ph. D. disserta-tion, Dept. ELEC. , Vrije Univ. Brussels, Belgium,1995.
  • 3Frans Verbeyst, Rik Pintelon, Yves Rolain, et al. Sys-tem identification approach aApplied to drift estimation[C]. Instrumentation and Measurement Technology Con-ference, 2007.
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  • 5C. M. Wang, Paul D. Hale, Kevin J. Coakley. Least-squares estimation of time-base distortion of sampling os-cilloscopes[J]. IEEE Transaction on Instrumentation andMeasurement. 1999,48(6):1 324 -1 332.
  • 6P. D. Hale, C. M. Wang, D. F. Williams, K. A.Remley, and J. Wepman. Compensation of random andsystematic timing errors in sampling oscilloscopes[J].IEEE Trans. Instrum. Meas. . 2006,55(6):2 146 - 2154.
  • 7GONG Peng-wei, YANG Chun-tao, MA Hong-mei, etal. The application of high-speed photo-detector for cali-brating oscilloscope [ C]. Proceedings of InternationalSymposium on Photoelectronic Detection and Imaging2009, Beijing, 2009.
  • 8龚鹏伟, 马喆, 马红梅等. 取样示波器时基误差的最小二乘估计[C]. 2009 国防计量测试学术年会论文集. 贵阳, 2009.
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二级参考文献9

  • 1Jan Verspecht. Accurate Spectral Estimation Based on Measurements with a Distorted-Timebase Digitizer [ J ]. IEEE Transactions on Instrumentation and Measurement, 1994, 43(2) :210-215.
  • 2Cosart L D, Peregrino L, Tambe A. Time domain analysis and its practical application to the measurement of phase noise and jitter [ J ]. IEEE Transactions on Instrumentation and Measurement, 1997, 46(4) :l015 -1 019.
  • 3C. M. Wang, Paul D. Hale, and Kevin J. Coakley.Least-Squares Estimation of Time-Base Distortion of Sam- pling Oscilloscopes [ J ]. IEEE Transactions on Instru- mentation and Measurement, 1999, 48 ( 6 ) : 1324-1 332.
  • 4Gerd Vandersteen and Rik Pintelon. Maximum Likelihood Estimator for Jitter Noise Models [ J ]. IEEE Transaction on Instrumentation and Measurement, 2000, 49 (6): 1282-1284.
  • 5Frans Verbeyst, Yves Rolain, Johan Schoukens, et al. System Identification Approach Applied to Jitter Estimation [ A ]. Instrumentation and measurement Technology Conference [ C ], 2006, 1752 -1757.
  • 6Kevin J. Coakley, C. M. Wang, Paul D. Hale, et al. Adaptive Characterization of Jitter Noise in Sampled High- Speed Signals [ J ]. IEEE Transactions on Instrumentation and Measurement, 2003, 52(5):1537 - 1547.
  • 7T. Michael Souders, Donald R. Flach, Charles I-Iagwood, et al. The Effects of Timing Jitter in Sampling Systems [J]. IEEE Transactions on Instrumentation and Measurement, 1990, 39(1) : 80-85.
  • 8William L. Gans. The Measurement and Deconvolution of Time Jitter in Equivalent-Time Waveform Samplers [ J]. IEEE Transactions on Instrumentation and Measurement, 1983, 32(1) :126 - 133.
  • 9Tracy S. Clement, Paul D. Hale, Dylan F. Williams, et al. Calibration of Sampling Oscilloscopes with High- Speed Photodiodes [ J ]. IEEE Transactions on microwave theory and Techniques, 2006, 54(8):3 173-3 181.

共引文献6

同被引文献13

引证文献2

二级引证文献3

宇航计测技术
2014年 第1期

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