一种集成电路老化测试设备的嵌入式系统设计

Embedded Soft System for Integrated Circuit Burn-in Test Device

针对传统集成电路老化过程耗时长,老化成本高的问题,提出了老化中测试的研制方案。老化测试将器件的测试与老化过程同时进行,从而节约时间与成本。为了提高老化测试设备的通用性和性能指标,将嵌入式系统引用到老化测试设备领域,通过移植嵌入式Linux系统,开发驱动实现通信接口协议,编写老化测试代码,实现了芯片老化过程中的流程控制及数据通信功能。经实际电路仿真验证,能够实现64路数字信号通道芯片的老化测试。

Aiming at the problem of the high time cost in the traditional integrated circuit burn-in screen, the new de- sign scheme of Test during burn-in（TDBI） is proposed. Test during burn-in is a combination of functional test and burn-in screen, thus reducing time and cost of burn-in process. In order to improve the versatility and performance of the burn-in test device, embedded system is quoted in the field of developing burn-in test device. The design through the transplant of embed- ded Linux system and the development of drivers to realize communication interface protocol, programmes the soft system codes to realize the flow control and data communication in the process of burn-in test. Verified by practical circuit simula- tion, this system can implement as much as 64 ports digital chip＇s burn-in test.