一种基于伪失效的Wiener退化产品可靠性评估方法

Reliability Assessment Approach for Wiener-type Degradation Based on Pseudo Failure

在高靠长寿命产品的退化试验中,性能退化量首次达到失效阈值的时间往往服从某种寿命分布,因此拥有充足的退化失效数据(首达时间)就可获得产品的寿命分布,而实际中高可靠性产品在有限的时间内很难获得真正超过失效阈值的失效数据,针对定时截尾加速退化试验,提出一种通过伪阈值获得寿命分布信息的方法,以Wiener退化产品为例,建立了伪阈值、应力及寿命分布参数之间的模型,并通过金属化电容器的实例验证了方法的有效性。

For the degradation testing of high reliability and long life products, the first-passage-time of degradation paths at- ways follow some distribution, so the life distribution can be obtained by collecting more degradation failure data, however, it＇ s diffi- cult to obtain the really failure data exceeding the failure threshold in actual. This paper presented the concept of intermediate threshold according to time-censored ADT, that the life distribution information obtained through intermediate threshold, took Wie- ner degradation products for research object, the relationship between intermediate threshold and stress and the scale parameter of life distribution is modeled. The example of metalized film pulse capacitor is used to illustrate the validity of the method.