摘要
在高靠长寿命产品的退化试验中,性能退化量首次达到失效阈值的时间往往服从某种寿命分布,因此拥有充足的退化失效数据(首达时间)就可获得产品的寿命分布,而实际中高可靠性产品在有限的时间内很难获得真正超过失效阈值的失效数据,针对定时截尾加速退化试验,提出一种通过伪阈值获得寿命分布信息的方法,以Wiener退化产品为例,建立了伪阈值、应力及寿命分布参数之间的模型,并通过金属化电容器的实例验证了方法的有效性。
For the degradation testing of high reliability and long life products, the first-passage-time of degradation paths at- ways follow some distribution, so the life distribution can be obtained by collecting more degradation failure data, however, it' s diffi- cult to obtain the really failure data exceeding the failure threshold in actual. This paper presented the concept of intermediate threshold according to time-censored ADT, that the life distribution information obtained through intermediate threshold, took Wie- ner degradation products for research object, the relationship between intermediate threshold and stress and the scale parameter of life distribution is modeled. The example of metalized film pulse capacitor is used to illustrate the validity of the method.
出处
《仪表技术与传感器》
CSCD
北大核心
2014年第4期88-90,共3页
Instrument Technique and Sensor
基金
国家自然科学基金(61271153)
关键词
伪失效
维纳退化模型
加速退化试验
可靠性评估
pseudo failure
Wiener degradation model
Accelerated degradation testing
Reliability assessment