摘要
给出一种对晶体管开关参数(二极管反向恢复时间trr,晶体三极管开启时间ton和关闭时间toff以及延迟时间td,上升时间tr,存储时间ts和下降时间tf) 进行自动测试的系统TSP-ATS。论文以存储电荷Qs作为PN结开关特性及晶体三极管的开关参数为实测对象,论述了自动测试系统的工作原理;给出了系统测试方案和TSP-ATS的硬件设计方框图及测试软件的主流程图;对接口功能设计的状态图作了较详细的介绍并给出了最终的测试结果。
Presented in the paper is an auto-test systern to test the transistor switch parameters (diode back recovered time tn,transistor trioxide oper time ton,closed time toff delaged time td,rising time tr,stored time ts,and falling time tf).Taking the stored electric charge Qs as an object for measuring the characteristics of PN connected switch and the switch parameters of transistor triode,the paper discusses the working principle of the autotest system and puts for ward systematic test plans ,the design frame of TSP-ATS hardware and the main flow chart.It also gives a detailcd intoduction to the state diagram of the interface functional design and presents the final result of the measurment.
出处
《重庆师范学院学报(自然科学版)》
2001年第1期69-73,共5页
Journal of Chongqing Normal University(Natural Science Edition)