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嵌入式代码覆盖率统计方法 被引量：3

STATISTICAL METHOD OF EMBEDDED CODE COVERAGE
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摘要 阐述如何利用GCC配套的代码覆盖率工具GCOV和LCOV对C语言嵌入式代码进行覆盖率统计。利用该方法可以为嵌入式代码测试完成情况提供衡量的指标,也为提高单板代码质量提供有效的数据依据。 In this paper we explain how to use the supporting code coverage tools GCOV and LCOV of GCC to carry out the coverage statistics on the embedded C language code. Using this method,it can provide measurable indicators for the completion status of embedded code test,and provide the effective data basis for improving the quality of embedded code.
作者 周雷
机构地区 同济大学电子与信息工程学院
出处 《计算机应用与软件》 CSCD 北大核心 2014年第5期326-327,共2页 Computer Applications and Software
关键词 C语言 覆盖率 GCOV LCOV C Language Coverage GCOV LCOV
分类号 TP311 [自动化与计算机技术—计算机软件与理论]
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参考文献7

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  • 1A Evans, A Silburt, et al. Functional Verification of Large ASICs [C]. Proceedings of the 35th Design Automation Conference, San Francico, California, USA, AC M Press, 1998. 650 - 655.
  • 2M Benjamin, et al. A Study in Coverage-Driven Test Generation [ C ].Proceedings of the 36th Design Automation Conference, New Orleans,Louisiana, USA, ACM Press, 1999.970-975.
  • 3A Aharon, D Goodman, et al. Test Program Generation for Functional Verification of PowerPC Processors in IBM [ C ]. Proceeding of 32nd Design Automation Conference, San Francisco, California, USA,ACM Press, 1995.279-285.
  • 4J Shen, J Abraham. A RTL Abstraction Technique for Processor Microarchitecture Validation and Test Generation [ J ]. Journal of Electronic Testig: Theory and Application,2000,(6) :67-81.
  • 5S Tasiran, et al. Coverage Metrics for Functional Validation of Hardware Designs [J]. IEEE Design and Test of Computers, 2001,18(4) : 36-45.
  • 6A Evans, A Silburt, et al. Functional Verification of Large ASICs[C].Proceedings of the 35th Design Automation Conference, San Francico,California, USA,ACM Press,1998.650-655.
  • 7M Benjamin,et al.A Study in Coverage-Driven Test Generation[C].Proceedings of the 36th Design Automation Conference, New Orleans, Louisiana, USA, ACM Press, 1999.970-975.
  • 8A Aharon, D Goodman, et al. Test Program Generation for Functional Verification of PowerPC Processors in IBM[C].Proceeding of 32nd Design Automation Conference, San Francisco, California, USA, ACM Press, 1995.279-285.
  • 9J Shen, J Abraham.A RTL Abstraction Technique for Processor Microarchitecture Validation and Test Generation[J].Journal of Electronic Testig: Theory and Application,2000,(6):67-81.
  • 10S Tasiran,et al.Coverage Metrics for Functional Validation of Hardware Designs [J].IEEE Design and Test of Computers, 2001,18(4): 36-45.

共引文献42

同被引文献26

引证文献3

二级引证文献6

计算机应用与软件
2014年 第5期

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