专用VAD集成电路可测性设计研究

DFT Study on Application-Specific VAD Integrated Circuits

在专用集成电路设计中 ,基于功能单元的片上系统 (FCBSOC,function- core- based system- on- a- chip)设计技术正得到广泛使用 .这种片上系统的可测性设计方法很多 ,如 Fscan- Bscan法、Fscan- Tbus法和层次化测试生成法等 .通过对这些可测性设计方法的研究 ,该文提出一种测试开销低、测试故障覆盖率高的层次化分析法来实现专用VAD(Video add data)集成电路的可测性设计 .

Techniques of function-core-based systems-on-a-chip are currently used in ASIC'(application-specific integrated circuits) design. There are many DFT(design for testability) methods for such core-based systems, including mothods of Fscan-Bscan and Fscan-Tbus, and hierarchical test generation, etc. This paper presents a DFT method named HAM (hierarchical-analysis method) for application-specific VAD(video add data) integrated circuit. Low test overhead and the high fault coverage can be achieved by using HAM.