真空镀铝膜铝层厚度检测方法探讨

Discussion about the Aluminum-layer Thickness Detection Method of Vacuum Aluminum Laminated Film

真空镀铝膜的铝层厚度是和复合包装制品的质量密切相关的一个重要指标，本文介绍了复合包装制品所用真空镀铝膜铝层厚度的要求以及检测方法，并建议用检测光密度（OD）和表面电阻（Ω／口）的方法来检测铝层厚度。

The thickness of vacuum aluminum plating film is an important indicator closely related to the quality of composite packaging products.This paper introduces requirements of the composite packaging products for the thickness of film and the detection method,and suggests to apply methods used to detect optical density （OD） and surface resistance （ Ω / 口） to detect aluminum layer thickness.