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用于极低温测量的真空密封多芯探测杆设计

Vacuum Sealed Multi-core Probe Designed for Extremely Low Temperature Measurements
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摘要 一些量子器件的电学特性需要在极低温的环境中进行测试标定。一般测量需要在温度为4.2K的液氦环境中进行。为满足需求,设计了低温密封探测杆。可将需要测量的样品固定于样品杆底端,通过样品杆将样品置于充有液氦的液氦罐内。实验中测量到的信号将通过样品杆内的低导热率测量线从杆的底端传输至顶端密封盒,后传输出到外部测量设备。本文基于Auto CAD软件的描述,介绍样品杆的外部设计和内部构造。 The electrical characteristics of most quantum devices have to be measured at extremely low temperature environments. The general measurement needs a temperature of 4.2K liquid helium environment. Before the experiment, we should design that kind of probe, making samples fixed in the bottom of the sample holder, so the information can be transfered to the top of the probe, named sealed box. Based on the description of the Auto CAD software, the external design and the internal structure of the probe will be shown.
出处 《中国仪器仪表》 2014年第4期54-57,共4页 China Instrumentation
关键词 极低温 真空密封 样品杆 AUTO CAD Extremely low temperature Vacuum sealed Sample probe Auto CAD
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