充放电电容检测电路中电荷注入影响的补偿

The Effect and Compensation of Charge Injection Capacitance for Charge/Discharge Capacitance Measuring Circuits Used in Electrical Capacitance Tomography

在电容成像系统中 ,由于采用充放电电容检测电路 ,从而存在着 CMOS模拟转换开关所带来的电荷注入问题 .这里给出一种补偿方法 ,使得可以通过充放电电路本身来测得的电荷注入电容得到补偿 ,并经过实验证明了这种补偿的有效性 .

In electrical capacitance tomography,the charge/discharge circuitt suffers from the charge injection problem arising from the CMOS switches.This paper gives a compensation method to balance the charge injection capacitance by the circuit itself.The experimental results show the charge injection capacitance compensation method is effective.