摘要
液晶作为一种最有前途的平板显示材料,其分子在液晶盒内的排列特性对显示器件的设计及制作无疑是极为重要的。衰减全反射法(简称ATR方法)最早应用于对金属薄膜特性的研究,后来逐渐成为研究各类介质光学性质的有力工具。最近几年,这种方法在研究液晶在液晶盒内的排列性质方面展现了强大的活力。本文介绍了衰减全反射法的基本原理、实验方法并将它应用于探测向列相液晶CP—9001 LA的排列性质。
Being a flat display material, liquid crystal has immense premise. It’s molecular aligning properties in a liquid crystal cell arc undoubtedly very important lor the designing and making a display device. Attenuated Total Reflection (ATR) method was used to study the properties of metal film in the early days, it has become a powerful tool for the study of properties of many kinds of media. In recent years this method has shown that it has a strong vitality in the study of the aligning properties in a liquid crystal cell. In this paper, the fundamental principle and the experiment method of ATR and the it’s application in the analysis the aligning properties of the nematic liquid crystal CP 9001 LA arc introduced.
出处
《液晶通讯》
CAS
1995年第1期6-11,共6页