基于傅里叶变换条纹相位法对KTN晶体二次电光系数测量的探究

RESEARCH ON THE MEASUREMENTS OF KTN CRYSTAL QUADRATIC ELECTRO-OPTIC COEFFICIENT BASED ON FOURIER TRANSFORM METHOD FRINGE PHASE METHOD

基于在三维形貌测量中广泛使用的傅里叶变换轮廓法，提出了一种测量KTN晶体二次电光系数的新的方法，并设计了基于麦克尔逊干涉的实验平台，进行了多次试验，得到了KTN晶体二次电光系数张量矩阵三个独立分量中的确定值。

We proposed a new method to measure Quadratic electro-optic coefficient in KTN crystal based on Fourier transform profilometry method widely used in 3 D topography measurement.We designed an experiment platform based on Michelson interferometer,one of the three independent components ---h1 1 in KTN crystal quadratic electro-optic coefficient tensor matrix was calculated.