摘要
三维物体表面形貌测量系统是通过数字正弦光栅移相原理来实现,当在测量时根据移相要求投射出正弦结构光,它及易受到外界光强的影响。本文通过在三维数据获得过程中外界自然光线对系统的影响,系统自适应光线强度,以致调节达到最佳测量光强环境。系统中应用嵌入式芯片FPGA为主控制器,通过控制图像采集芯片CMOS摄像头采集光强数据,利用VGA接口投射背景光强度来对比调节,测量环境的光强度通过一种PWM波控制高亮LED完成自适应的方法。
Three dimensional shape measurement system is realized by digital sinusoidal grating phase shifting principle, according to the phase shift requirements projected sinusoidal light, when it does in the measurement, it is easily influenced by external light intensity. In this paper, through the influence of external natural light in the process of the system in the 3D data, it can be adapted to light intensity in the system, to the best measurement of light intensity environment regulation. The system is applicated to embedded chip FPGA as the main controller, it is through the control of image acquisition chip CMOS camera capture light intensity data, and to compare regulation by the use of VGA interface projected background light intensity, light intensity through a method of PWM wave controls the brightness of LED completes the adaptive measurement environment.
出处
《自动化技术与应用》
2014年第6期52-56,共5页
Techniques of Automation and Applications