基于单片机的APD参数测试系统设计

The design of the APD parameters test system based on SCM

雪崩光电二极管(APD)是一种高灵敏度、高速度的光电器件,是光纤接入的必备核心器件。其性能测试在业界一直存在成品率低、生产效率不高、精度低、不能大规模用于生产测试等问题。本测试系统采用单片机控制,具有价格低廉,效率高等特点,与国外普遍使用的数字源表来测量APD参数相比具有明显的优势。

The avalanche photodiode（ APD） with high sensitivity and high-speed is the essential core of the fiber access triple play network device,and it＇s performance testing has been a low yield,production efficiency and accuracy in the industry.So they cannot be used for large-scale production. The test system in this paper controlling by the MCU have many characteristics,such as low price and high efficiency,to compare with foreigners mainly use source table to measure the APD parameters,it also has obvious advantages.