一种新的可测试性测度

A NEW TESTABILITY MEASURE OF DIGITAL CIRCUITS

本文提出了一种新的可测试性测度SCTM(A Singal Confilct oriented TestabilityMeasure)。该测度是一种scoap-like测度,它不但代表了电路中各点控制和观察的难易,而且代表了测试过程中产生信号冲突的可能性。文中引入了并行计算策略,使计算速度提高了大约m/2倍,m为计算机字长。

A new scoap-like testability measure SCTM(a signal conflict oriented testability meaure) is presented, which represents not only the difficulty to control and observe the value of a node,but also the probability to cause signal conflict in the process of test generation. A parallel calculation scheme is offered, which speeds up the calculation m/2 times. Here m is the word length of a computer.