圆柱TE_(011)模腔外的微扰应用

The Multi-Parameters measurement with Perturbation Method out of the TE_(011)-mode Cylindrical Cavity

本文分析圆柱腔TE0 11模端盖上的两个对称隙缝的特性 ,阐明用其测量片状材料的原理和条件。介绍了测量片状小损耗介质介电常数、半导体电导率及非平衡载流子寿命等参数的结果。实验表明 ,圆柱TE0 11模端盖的对称隙缝可用于高精度、多功能、宽量程测量片状材料参数 ,且测量是无接触的 ,无需对样品进行特殊的加工。

The paper analyses the specificity of the symmetry slots of the port-cover of the TE 011 -mode cylindrical cavity,and presents its theory and condition for measurement of flake materials.The measurement results of complex dielectric constants of low loss and thin flake materials,conductivity and nonequilibrium charge carrier lifetime of semiconductor are introduced.From the experiment,we conclude that the symmetry slots on the portcover of TE 011 -mode cylindrical cavity can be used for high precision,multifunction,wide range measurement of flake materials' parameters,moreover the measurement is contactless,and the samples don't need special processing.