摘要
给出了平面测试问题的一种新型的神经网络算法 .该算法不仅能够测试可平面图、寻找非平面图的最大可平面子图 ,而且能够把一个可平面图嵌入在一条直线上 .并通过实验验证了算法的可行性 .
A new neural network algorithm for the planarity testing problem is presented. The algorithm, which is designed to embed a graph on a line, uses a large number of simple processing elements called neurons. It not only tests a planar graph but also embeds the planar graph on a single line. It can be used in multiple layer problems such as designing printed circuits boards and routing very large scale integration circuits.
出处
《西安电子科技大学学报》
EI
CAS
CSCD
北大核心
2001年第2期245-248,共4页
Journal of Xidian University
基金
国家自然科学基金资助项目 !( 6 99710 18)