低能γ射线反散射法测量纸张定量的研究

Study on measuring the paper basis weight by low energy γ-ray backscattering techniques

叙述了低能 γ射线反散射法测量纸张定量的可能性 ,建立了纸张定量与反散射 γ射线强度的关系式。研制了一套测量装置 ,并对测量误差进行了分析。

This article introduces possibility for measuring the paper basis weight (mass thickness per unit area)by low energy γ ray backscattering techniques.The relation between the paper basis weight and the intensity of low energy γ ray backscattering has been established.A measuring device has been complected and its measuring results are analysed.