摘要
本工作采用金硅面垒半导体探测器对^(252)Cf放射性衰变进行了跟踪测量。得到了^(252)Cf放射性衰变的半衰期为T_(1/2)=2.638±0.009a,结果与以前的工作符合。
The follow-up measurements have been made by using a Si(Au) detecter with small solid angle geometry for a disintegration of 252Cf.The measured half-life of disintegration is 2.638±0.009 year. This value is in accor dance with other previous results.
出处
《核技术》
CAS
CSCD
北大核心
1991年第6期352-354,共3页
Nuclear Techniques
