差示ATR光谱法定量分析聚合物膜表层

QUANTITATIUE ANALYSIR OF POLYMER FILM SURFOUE LAYER BY DIFFERENTIAL ATR SPECTROSCOPY OF IR

本文利用差示ATR光谱法对聚合物膜表层的化学成分作定量分析。在相同条件下测定表混合组分及其各纯组分的ATR谱图。选择特证吸收带,利用计算机差谱技术,将混合光谱分离,得到被测组分差谱图。粮据图中特征带的吸光度比值,求出该组分的百分含量。此分析方法的特点是无需进行化学分离,能快速地分离混合物光谱,因而能直接方便地对聚合物膜表层化学成分作定量分析。

In this paper, chemical component of palymer film surface layer was quantitatiue determinated by differential ATR spectroscopy of IR. With same condition, the ATR spectra of mixture and pure components wore measured seperately. The key band was , sejected. After sperating, the difference spectrum of component to be measured was obtained. The percent content was caeulated by ratios of absorbance of the key bands Seperating mixture spectrum of polymer film surface layer quickly without chemical seperation was the charctoristics of this methed, There fore the chemical component of polymer film surface layer was quantitatiue determined directly and conveniently.