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注C^+硅多孔结构的蓝光发射 被引量:4

Blue Emission from Porous Structures of C ̄+-Implanted Silicon
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摘要 对单晶硅进行C+注入,注入能量为50keV,注入剂量为1×1015~1017/cm2.在N2中经950℃退火1小时后,注入层形成尺寸为1~3μm的β-SiC沉淀.进而采用电化学腐蚀方法将样品制成多孔结构.在紫外光激发下,样品可以发射强度较大的蓝光,光强是通常多孔硅的数倍以上,谱峰处于480nm和505nm附近.这一方法简便有效地实现了硅基材料的蓝光发射. Abstract Carbon ions were implanted into single crystal silicon wafers at an energy of 50 keV and with doses ranging from 1×1015 of 1×1017/cm2. The precipitation of β-SiC was occurred beneath the surface of the samples thermalty annealed in N2 at temperature of 950℃ for 1 hour. Porous structure of sample was prepared by conventional anodized oxidation. Under ultraviolet excitation, the samples have intensive blue emission peaked at 480um and 505um, and the intensity is several times stronger than that of the common porous silicon. This is an effective method to produce Si-based blue emission materials.
出处 《Journal of Semiconductors》 EI CAS CSCD 北大核心 1995年第4期314-316,共3页 半导体学报(英文版)
基金 国家自然科学基金
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