摘要
应用飞行时间二次离子质谱 (TOF SIMS)对源岩单组分进行原位微分析 ,结果表明有机组分(1)二次离子峰集中分布在低质量数一端 ;(2 )无机离子峰强度普遍高于有机离子峰 ;(3)同类型相邻的有机离子峰之间相差一定单位的质量 (14,即CH2 ) ;(4 )不同有机组分峰强度最大的有机离子相同 ,但它们峰的相对强度差异非常明显 ,借助有机离子峰的相对强度可以反映有机组分的化学结构及其生烃性特征。
Individual maceral of the source rocks has been analyzed by using Time of Flight Secondary Ion Mass Spectrometry (TOF SIMS). The results show that (1) the secondary ions of the macerals mostly gathered at the side of lower mass ( m/z <100); (2) the intensity of inorganic ions is generally higher than that of organic ions; (3) there is a certain mass (14,CH 2 ) difference between the two neighbor organic ions of the same type and (4) the organic ions with maximum intensity of different macerals is alike. But the ion intensity of different macerals varies greatly, which reflects the chemical properties of the macerals and the character of the maceral chemistry and their hydrocarbon potential.
出处
《地学前缘》
EI
CAS
CSCD
2001年第2期421-423,共3页
Earth Science Frontiers
基金
中国博士后科学基金!资助项目 (1999/10 )
