二值网络故障测试与三值代数

Fault Testing in Binary Logic Networks with Ternary Algebra

本文采用三值代数所推出的指数运算的规则去研究二值网络的故障测试.首先,单故障测试生成算法I用于冗余网络(初级输入线有多扇出分支)．算法Ⅱ解决有冗余和多扇出无竞争式单故障测试.最后,本文定了运算,并用于一般化冗余和多扇出单故障测试生成算法Ⅲ.

This paper deals with the fault testing in binary logic networks by using the rule of the exponential operation, which is derived from Ternary algebry. Firstly, algorithm I of single fault test generation is applied to the irredudant networks (with the existence of fan-out paths in primary input). Algorithm Ⅱ has solved the testing non - race - like single fault in the reducant and fan-out paths networks. Finally, this paper Algorithm Ⅲof the testing single fault in any reducant networks with fan-out paths.