摘要
本文论述在透射式照明条件下用线列 CCD 测量铜板宽度和检测孔洞缺陷的信号处理。用两次锁存法可巧妙地提取有孔洞缺陷时的板宽值。
The article describes signal processing for width measurement and hole defect detection of cold-rolled steel plate using linear CCD under the transi- llumination.The value of width can be acquired ingeniously by using duplex latch mode while there is a hole defect in the steel plate.
出处
《半导体光电》
CAS
CSCD
北大核心
1991年第1期37-41,共5页
Semiconductor Optoelectronics
