期刊文献+

热打印头的失效机理与寿命分析

Degradation Causes and Life Estimation of Thermal Printing Heads
下载PDF
导出
摘要 在对热印头进行高温存储实验、震动实验、脉冲加热实验和实际打印实验的基础上,总结出热印头失效的五种模式,并分析了各种模式的失效原因;论述了提高热印头寿命的措施。 Long lifetime is a base for thermal printing heads to be applied widely. Experiments on these thermal printing heads include high temperature storage tests, shaking tests, pulse-heat tests, and actual thermal printing tests. From the experiments, five degradation modes of thermal printing heads are summarized. The degradation reasons for the five modes are analyzed and the means of increasing the lifetime of thermal printing heads are demonstrated.
出处 《电子科技大学学报》 EI CAS CSCD 北大核心 2001年第2期181-184,共4页 Journal of University of Electronic Science and Technology of China
基金 国家重点科技公关项目
关键词 薄膜热印头 热打印机 失效机理 热打印头 thin film thermal printing head thermal printers degradation causes lifetime
  • 相关文献

参考文献2

  • 1[1]Shibata Sutumu, Murasugi Kaji. Kaminishi Katsuzo. New tape thermal printing head with thin film. IEEE Trans Parts, Hybrids, 1976, (3): 223~230
  • 2[2]Tokunaga Yukio, Yoshida Mitesuyoshyshi, Kizawa Masayosshi. Life estimation of thermal print heads consisting of Ta2N thinfilm resistors. IEEE Trassachons on Componments, Hybrids, Manufacturing Technology, 1981, (1): 148~153

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部