铝外壳Si(Au)面垒探测器受快中子辐照后性能恢复的研究

Recovery of Si(Au) detectors exposed to fast neutron radiation

本文研究了探测器经注量<10^(13)n/cm^2的快中子辐照后,在重新加偏压过程中它们的反向电流猛增而使性能变坏的原因,然后采用慢加偏压的方式恢复了探测器的性能,延长了使用寿命。

The reason why Si(Au) detectors deteriorate when rebiasing after exposed to a fast neutron flux up to 1013n/cm2 is studied experimentally. By slowly applying the bias, the performance of the detectors could be recovered and their service life be prolonged.