云纹干涉法在线复制变形光栅技术研究

A Technique of Deformed Speciment Grating Replication for in Situ Measurement of Moire Interferometry

介绍了一种云纹干涉法现场转移高密度光栅的新工艺 ,将现场转移光栅与实验室测量有机结合起来 ,同时得到物体变形的面内U、V位移场。从理论上分析讨论该方法的可行性及误差 ,通过实验验证该方法与传统云纹干涉法具有相同的灵敏度和量程 。

An in situ measurement technique deformed specimen replication has been given. The recorded information on the deformed specimen grating can be extracted by using a typical four beam moire interferometer. Typical fringe pattern of U field and V field displacement contours obtained from the test. The theoretical analysis and experimental result have proved that the technique with the advantages of real time moire interferometry is suitable for a wide range of applications.