期刊文献+

Pb_(1 - x) Ge_x Te薄膜的光学性质 被引量:4

OPTICAL PROPERTIES OF Pb _( 1- x ) Ge _ x Te FILMS ZHANG Su Ying FAN Bin LI Bin
下载PDF
导出
摘要 对 PVD沉积 Pb1 - x Gex Te薄膜研究发现 Pb1 - x Gex Te是一种高性能的红外材料 ,在 3~ 2 5μm光谱范围具有较好的透光性能 ,室温下的折射率为 4.8~ 5 .6 .薄膜的光学性质 ,包括透射率、色散关系以及折射率的温度系数dn/ d T,与材料中组分 x、环境温度和薄膜的沉积工艺条件有密切关系 .适当地改变组分和工艺条件 ,可以使薄膜的折射率温度系数 dn/ d T从负变到零并转为正 。 Study of Pb1-xGexTe films deposited by PVD revealed that Pb1-xGexTe is a kind of fine characteristic infrared materials, which has a high transmission in the spectral range 3 similar to 25 mum, and has indices of refraction in the range 4.8 similar to5.6 at room temperature. Optical properties, which include transmission spectrum, dispersion spectrum and temperature coefficient dn/dT of refractive index, depend strongly on content x, environmental temperature and deposition conditions. It can be found that proper change of content x and deposition conditions may result in the change of temperature coefficient dn/dT of refractive index from negative to zero, and to positive from zero, which is of significance for manufacturing highly stable infrared optical filters.
出处 《红外与毫米波学报》 SCIE EI CAS CSCD 北大核心 2001年第1期69-72,共4页 Journal of Infrared and Millimeter Waves
基金 国防科技预研基金! (编号 97J2 0 .3.2 .ZK0 70 3)&&
  • 相关文献

参考文献4

  • 1张凤山 朱玲心 等.测量薄膜材料n,k,d的一种简单方法[J].红外研究,1986,3(5):189-189.
  • 2Zhang Suying,SPIE 3175,1998年,429页
  • 3Zhang Suying,SPIE 1519,1991年,508页
  • 4张凤山,红外研究,1986年,3卷,5期,189页

共引文献1

同被引文献10

  • 1斯剑霄,吴惠桢,徐天宁,曹春芳,黄占超.Microstructural Properties of Single Crystalline PbTe Thin Films Grown on BaF2(111) by Molecular Beam Epitaxy[J].Chinese Physics Letters,2005,22(9):2353-2356. 被引量:4
  • 2LI Bin, JIANG Jin-Chun, ZHANG Su-Ying, et al. Low-temperature dependence of mid-infrared optical constants of lead germanium telluride thin film [J]. J. Appl. Phys., 2002, 91(6): 3556-3561.
  • 3S Y Zhang, C Cheng, J Ling, et al. The effects of processing conditions on PbGeTe film performances [J]. SPIE, 1998, 3175: 429-432.
  • 4ZHANG S Y,XU B Y,ZHANG F S,et al.Preparation of Pb1-xGexTe crystal with high refractive index for IR coating[J].SPIE,1991,1519:508-513.
  • 5ZHANG S Y,CHENG C,LING L,et al.The effects of processing conditions on PbGeTe film performances[J].SPIE,1998,3175:429-432.
  • 6LI B,ZHANG S Y,JIANG J C,et al.Improving low-temperature stability of infrared thin-film interference filters utilizing the intrinsic properties of Ⅳ-Ⅵ narrow gap semiconductors[J].Opt Express,2004,12(3):401-404.
  • 7LI B,ZHANG S Y,JIANG J C,et al.Recent progress in improving low-temperature stability of infrared thin-film interference filters[J].Opt Express,2005,13(17):6376-6380.
  • 8LI B,ZHANG S Y,XIE P,et al.Improving low-temperature performance of infrared thin-film interference filters utilizing temperature dependence of refractive index of Pb1-xGexTe[J].SPIE,2005,5640:587-593.
  • 9金进生,吴惠桢,常勇,寿翔,X.M.Fang,P.J.McCann.硅基PbSe/BaF_2/CaF_2薄膜及其光电特性[J].红外与毫米波学报,2001,20(2):154-156. 被引量:4
  • 10李斌,张素英,谢平,张凤山.利用Pb_(1-x)Ge_xTe材料的折射率异常性质改善红外光学薄膜的低温性能[J].光学仪器,2004,26(2):168-173. 被引量:2

引证文献4

二级引证文献4

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部