摘要
介绍了测试Si、Ge、GaAS等单晶材料性能参数的一种方法—Vandepauw法,通过实验和分析,得到了测试过程中电极的制作和测试的最佳条件.
This paper introduces the basic principle of Van De Pauw method which is generally used for the electrical characterization measurements to Si Ge GaAS and other crystal materials.Through test and analysis,we have got some optimum conditions in poles making and measurement courses.
出处
《聊城师院学报(自然科学版)》
1998年第4期45-47,共3页
Journal of Liaocheng Teachers University(Natural Science Edition)