全介质窄带滤光片膜厚均匀性分析

Research on the Uniformity of All-dielectric Narrow Band Filter′s Layer Thickness

对全介质窄带滤光片镀制时因基片位置不同引起的透射率曲线的变化进行了分析 ,得出了其透射率曲线形状基本保持不变仅中心波长发生偏移的结论 .根据所得的结论 ,提出了用于DWDM光纤通信系统的滤光片的实际镀制的改进方案 .

The change of the transmittance curve of the all dielectric narrow band filter caused by the substrate position difference is analyzed. The conclusion is that the shape of the transmittance curve has been basically holding the line with the center wavelength deviation. According to the conclusion, the practice coating project of the filter used in the DWDM optical fiber communication system is improved.