扫描隧道显微镜扫描模式研究

STUDY ON SCANNING MODE OF SCANNING TUNNELING MICROSCOPE

在对扫描隧道显微镜模式研究的基础上 ,首次提出“符合扫描”模式 ,不但从理论上消除了原有扫描模式带来的测量误差 ,而且还使测量速度提高了 70 % .这种模式可以应用于几乎所有扫描探针显微镜仪器的 Z轴反馈控制 ,对原子量级信息读取速度和精度的提高具有重要意义 .

Based on the study on the scanning mode of STM,the “Coincidence Scanning Mode”is described in this paper.This mode can not only anoid the error in theory of probe but also reduce the scanning time by 70%.It can be applied almost in the feedback control of Z axis of all SPM instruments.It is very important to recognize atoms accurately and speedily.