一种时序电路的测试生成算法

A Test Generation Algorithm for Sequential Circuits

本文提出了一种高效的时序电路测试生成算法,该算法是建立在自适应算法的基础上,并使用了十七值逻辑模型。文章详细介绍了该测试算法的内容及其实现过程,并举例说明了该算法的测试效率。

This paper presents an efficient sequential circuit automatic test generation algorithm. The algorithm is based on self- adapting algorithm and uses a seventeen - valued logic model. In the paper implementation of the algorithm is presented in detail and the test efficiency of the algorithm is illustrated.