摘要
对上海同步辐射装置 (SSRF)的一条用于XAFS研究的光束线的初步设计进行了介绍 .该设计以弯铁辐射作为光源 ,光束线光学系统采用聚焦和不聚焦两种光学模式 .用追迹程序Shadow对光束线性能进行模拟计算 ,聚焦模式在 5～ 2 5keV的能量范围内样品位置的光斑尺寸为 0 .5× 0 .5mm2 ,光强高于 1 0 11photons/s,高次谐波成分小于 1 0 -4 ,适合于用荧光XAFS方法研究低浓度及表面样品体系 ;不聚焦模式可用的能量范围较宽 ( 4～ 40keV) ,样品位置的光斑尺寸小于 5 0× 2mm2 ,光强高于 1 0 9photons/s ,高次谐波成分小于 1 0 -2 。
This paper is a preliminary design for an XAFS beamline at the SSRF. In this design, the bending magnet based radiation is used as the light source. The beamline designed has two optical modes, focused and unfocused. The performance data of the beamline are modeled by the ray tracing code SHADOW. For focused mode which is often applied in fluorescence XAFS for dilute and surface samples, the energy range is 5～25 keV, the beam size at the sample position 0.5×0.5 mm 2, the flux more than 10 11 photons/sec and the content of higher order harmonics less than 10 -4 . For unfocused mode which is mainly used to the standard XAFS, the energy range is 4～40 keV, the beam size at the sample position less than 50×2 mm 2, the flux more than 10 9 photons/sec and the content of higher order harmonics less than 10 -2 .
