半导体光放大器增益曲线的测量

Measurement of gain curves of semiconductor lsaer amplifiers

在半导体激光器端面镀减反射膜以后,我们测量了在高于镀前阈值条件下工作时二极管的增益谱。实验结果与理论相符。

The gain spectra of the diode laser with antireflective coatings on its facets has been measured under the condition of bias- sing higher than its threshold. The experimental results agree with the theoretical predictions.