摘要
双波长全息干涉术利用激光器发出的两个或两个以上不同的波长对物体拍摄全息干涉图 ,相当于用一个等效波长λeq对物体进行干涉测量 ,从而扩大了测量范围。在改进的泰曼干涉系统中 ,采用双曝光法双波长全息干涉术对一个抛物面反射镜的面形进行了补偿法检验 ,最终得到的干涉图样易于分析和判读。实验表明 ,对于光学元件的面形检验 ,尤其是非球面元件的面形检验 ,双波长全息干涉术是一种可行的测量新方法。
Two-wavelength holographic interferometry (TWHI) takes an object is holographic interference picture by two or more wavelengths created by laser. It is identical to use an equivalent wavelength λeq to test the object. Therefore the measurement range can be enlarged effectively. Using the improved Twyman interference system, a parabolic mirror is tested by double exposure method. The final picture of interference fringe is easy to analyze and evaluate. It shows that TWHI is a new feasible measurement method in surface testing of optical component, especially aspheric component.
出处
《宇航计测技术》
CSCD
2001年第2期1-5,共5页
Journal of Astronautic Metrology and Measurement
基金
北京市自然科学基金资助项目
