摘要
本文阐述了在跌落冲击试验时主冲击与次冲击的特点。计算了产品系统对整个冲击过程的响应，并分析了产品损坏的原因。当产品进行精密冲击试验时，消除次冲击是很有必要的。
This paper described the characteristics of major shock and secondary shocks in drop-test. It calculated the product system response on a shock course and analysed the reason of product damaging. When product conducts accurate shock testing, it is very necessary to eliminate the Secondary shocks.
出处
《电子质量》
2001年第6期55-59,共5页
Electronics Quality
关键词
次冲击
机电系统
跌落冲击试验
major shock, Secondary shocks
system response
product damage
eliminating secondary shocks
